- Bargain Basement
- Abrasive Blasting
- Adhesion
- Ambient Conditions
- Cases
- Cathodic Protection
- Coating Test Panels
- Coating Thickness Gauge
- Combination Gauges
- Compliance Programs
- Concrete Testing
- Corrosion Coupon Test Kits
- Dry Film Thickness Gauges
- Field Microscopes
- Gloss & Appearance
- Hardness Testing
- Holiday/Pinhole Detection
- Inspection Instrument Kits
- Miscellaneous
- Moisture Detection
- Powder Coating
- Publications
- Surface Cleanliness
- Surface Contamination Test Kits
- Surface Profile
- Wall Thickness Gauges
- Wet Film Thickness Gauges
X-Coarse 1.5 to 4.5 mils (38 to 115 microns)
$42.00
Testex replica tape is used in conjunction with an analog or digital spring-loaded micrometer for acquiring surface profile measurements according to Method C in ASTM D4417.
In stock (can be backordered)
Description
Testex replica tape is used in conjunction with an analog or digital spring-loaded micrometer for acquiring surface profile measurements according to Method C in ASTM D4417. The replica tape is rubbed onto the abrasive blast cleaned surface forming a reverse replica of the peak-valley pattern in the steel. The replica is quantified using a spring loaded micrometer to determine the maximum peak-to-valley depth. Each roll of tape contains 50 pieces.
Additional information
| Weight | 0.0500 lbs |
|---|
You may also like…
Related products
Using Coatings Inspection Instruments 3rd Edition
Completely updated, the 3rd edition includes instructions on the step-by-step use of 50 instruments and test kits for measuring ambient conditions (including electronic psychrometers), surface profile (including two digital depth micrometers and a new procedure for use of replica tape), SSPC visual guides, wet and dry film thickness, concrete testing, destructive coating thickness measurement, adhesion, holiday/pinhole detection and coating hardness. An updated list of surface cleanliness standards, an updated index of industry standards, and a new surface salt extraction and analysis procedure are also included.
