Description

Testex Press-O-Film Replica Tape

Testex Press-O-Film Replica Tape is used in conjunction with an analog or digital spring-loaded micrometer for acquiring surface profile measurements according to Method C in ASTM D4417. The replica tape is rubbed onto the abrasive blast cleaned surface forming a reverse replica of the peak-valley pattern in the steel. The replica is quantified using a spring loaded micrometer to determine the maximum peak-to-valley depth. Grade (descriptive) Range When Used With Gauge (mils) / (um) Coarse 0.8 to 2.5 / 20 to 64 X-Coarse 1.5 to 4.5 / 38 to 115 X-Coarse Plus 4.6 to 5.0 / 116 to 127 Each roll of tape contains 50 pieces.

The impression can be studied in several ways:

1. A simple micrometric dial thickness gage can be applied to the replica for field measurement of the average maximum peak-to-valley roughness, or “profile,” of a replicated surface, or,
2. A digital thickness gage such as the PosiTector RTR can also field-measure profile and bridge the gap between tape grades by incorporating automatic linearization.
3. An optical profiling interferometer or confocal microscope can be used in laboratory settings to produce maps of the replica’s surface topography. This is most appropriate to study of subtle features at the microinch (25 nanometer) level.